Formerly About Applied Materials Message Board

We're offering Lifetime and discounted 3-year Subscriptions this month only. Details here

To: BelowTheCrowd who wrote (25084)	10/9/1998 12:52:00 PM
From: Jeff Fox	Read Replies (1) of 70976

<A HREF='http://usas1.advfn.com/oasis/oasisc.php?s=45&w=336&h=280&t=_blank' TARGET='_blank'><IMG SRC='http://usas1.advfn.com/oasis/oasisi.php?s=45&w=336&h=280&t=_blank' WIDTH=336 HEIGHT=280 BORDER=0></A> Michael, re:AMD K-2 "yield" flaw many of the process problems manifest themselves in the form of intermittent failures This kind of problem is more likely to be a device design flaw rather than anything to do with the process. A common fault is to have a storage bit that gets set and reset at the same moment. The bit gets confused and goes to a one or a zero randomly. The bit works right more often than not when it escapes through the initial checkout procedure. Darn hard to find these at the silicon stage. Jeff
<A HREF='http://usas1.advfn.com/oasis/oasisc.php?s=56&w=750&h=50&t=_blank' TARGET='_blank'><IMG SRC='http://usas1.advfn.com/oasis/oasisi.php?s=56&w=750&h=50&t=_blank' WIDTH=750 HEIGHT=50 BORDER=0></A>